In recent years, the interest in applying machine learning (ML) and deep learning (DL) has been increasing due to their ability to learn to predict and find structure in data. The most common approach of ML and DL is supervised learning. Supervised learning requires the input data to be labeled. However, as reported by many industries, such as the embedded systems domain, fully labeled datasets are difficult to obtain since data labeling is manually intensive. This paper uses a semi-supervised learning approach on real-world Pulse-Doppler data obtained from our industry collaborator Saab to address this challenge. We took inspiration from the FixMatch algorithm. To investigate whether unlabeled data can help improve classification accuracy, we compare FixMatch to a supervised baseline. We use five different settings for the number of available labels per class label to investigate how many labeled instances and how much manual effort is required for optimal accuracy. Bayesian Linear Regression is used to analyze the results. The results show that FixMatch can reach a higher accuracy than the supervised baseline. Furthermore, FixMatch requires more computation time but will help reduce manual effort. In addition, FixMatch will not underfit or overfit. Thanks to this study, practitioners know the benefits of utilizing FixMatch and when it is safe to use to improve a supervised baseline in the industry.