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Studies of resolidification of non-thermally molten InSb using time-resolved X-ray diffraction
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2005 (English)In: Applied Physics A: Materials Science & Processing, ISSN 0947-8396, E-ISSN 1432-0630, Vol. 81, no 5, p. 893-900Article in journal (Refereed) Published
Abstract [en]

We have used time-resolved X-ray diffraction to monitor the resolidification process of molten InSb. Melting was induced by an ultra-short laser pulse and the measurement conducted in a high-repetition-rate multishot experiment. The method gives direct information about the nature of the transient regrowth and permanently damaged layers. It does not rely on models based on surface reflectivity or second harmonic generation (SHG). The measured resolidification process has been modeled with a 1-D thermodynamic heat-conduction model. Important parameters like sample temperature, melting depth and amorphous surface layer thickness come directly out of the data, while mosaicity of the sample and free carrier density can be quantified by comparing with models. Melt depths up to 80 nm have been observed and regrowth velocities in the range 2-8 m/s have been measured.

Place, publisher, year, edition, pages
Springer, 2005. Vol. 81, no 5, p. 893-900
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:mau:diva-44535DOI: 10.1007/s00339-005-3299-9ISI: 000230990200002Scopus ID: 2-s2.0-23944458119OAI: oai:DiVA.org:mau-44535DiVA, id: diva2:1578281
Available from: 2021-07-06 Created: 2021-07-06 Last updated: 2024-02-05Bibliographically approved
In thesis
1. Time-resolved X-ray diffraction studies of phonons and phase transitions
Open this publication in new window or tab >>Time-resolved X-ray diffraction studies of phonons and phase transitions
2005 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [sv]

Denna avhandling sammanfattar arbete där tidsupplöst röntgendiffraktion har använts för att undersöka kristallina material och studera dynamiken hos fononer och fasövergångar.Röntgendiffraktion är standardverktyget för stukturbestämning på en atomär skala. Det har använts länge och har framgångsrikt hjälp vetenskapsmän att bestämma strukturen hos en stor mängd material. Användningen av ultrasnabb tidsupplöst röntgendiffration är ett starkt växande område som fortfarande utvecklas.Akustiska impulser, eller koherenta akustiska fononer, har studerats med hjälp av optiska tekniker i åtminstonde två årtionden. Optiska pulser kan dock endast underöka en halvledares yta. Röntgen penetrerar djupare in i proven och kan följa fononer då de färdas in i proven.Realtidsstudier av fasövergångar har också utförts med hjälp av optiska metoder. Dessa mätningar är indirekta då de mäter ändringar i susceptibiliteten hos provet istället för atomernas positioner. Återigen kan tidsupplöst röntgendiffraktion ge en ny insyn i området genom att den gör en direkt mätning av de strukturella ändringarna.Den här avhandlingen fokuserar huvudsaklingen på experimentellt arbete där tidsupplöst röntgendiffraktion använts för att studera fononer eller prover som genomgår en fasövergång. En kort teoretisk bakgrund finns med, liksom en beskrivning av D611, ett synkrotronljusstrålrör för tidsupplöst röntgendiffraktion som utvecklats under arbetet med den här avhandlingen.

Abstract [en]

This thesis summarizes work in which time-resolved X-ray diffraction has been used to probe crystalline materials, thereby revealing the dynamics of phonons and phase transitions.X-ray diffraction is the standard tool in investigations of structure on the atomic scale. It has been used for a long time, and has successfully helped scientists to find the structure of a wide range of materials. The use of ultrafast time-resolved X-ray diffraction is a strongly emerging field which is still under development.Impulsive strain pulses, or coherent acoustic phonons, have been probed using optical techniques for at least two decades. Yet, optical pulses can only probe the surface of a semiconductor. X-rays penetrate deeper and can follow the phonons as they propagate into the sample.Real time studies of phase transitions have also been conducted using optical methods. These measurements are indirect in the sense that they probe the susceptibility change of the sample rather than the positions of the atoms. Again, time-resolved X-ray diffraction can give new insights into the field by probing the structural changes directly.This thesis focuses mainly on experimental work in which time-resolved X-ray diffraction has been used to probe phonons or samples undergoing phase transitions. A brief theoretical background will also be given, as well as a description of beamline D611 at MAX-lab, a synchrotron beamline for time-resolved X-ray diffraction measurements which has been developed during the work for this thesis.

Place, publisher, year, edition, pages
Department of Physics, Lund University, 2005
Series
Lund Reports on Atomic Physics, ISSN 0281-2762 ; 350
Keywords
X-ray diffraction, phonons, phase transitions
National Category
Physical Sciences
Identifiers
urn:nbn:se:mau:diva-7776 (URN)1843 (Local ID)91-628-6662-1 (ISBN)1843 (Archive number)1843 (OAI)
Note

Paper VII in dissertation as manuscript with title: "Transient metal-like heat conduction in a semiconductor"

Note: The papers are not included in the fulltext online

Available from: 2020-02-28 Created: 2020-02-28 Last updated: 2024-02-26Bibliographically approved

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