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Neutron reflectometry and hard X-ray photoelectron spectroscopy study of the vertical segregation of PCBM in organic solar cells
Advanced Materials for Production and Storing of Energy, Technical University of Cartagena, Plaza del Hospital 1, Cartagena, 30202, Spain.
Advanced Materials for Production and Storing of Energy, Technical University of Cartagena, Plaza del Hospital 1, Cartagena, 30202, Spain.
Advanced Materials for Production and Storing of Energy, Technical University of Cartagena, Plaza del Hospital 1, Cartagena, 30202, Spain.
Departament of Physics, Instituto Universitario de Investigación en Óptica y Nanofísica (IUIOyN), University of Murcia, Campus de Espinardo, Murcia, 30100, Spain.
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2019 (English)In: Solar Energy Materials and Solar Cells, ISSN 0927-0248, E-ISSN 1879-3398, Vol. 191, p. 62-70Article in journal (Refereed) Published
Abstract [en]

The composition of the active layer of a benchmark functional glass/ITO/[P3HT:PCBM][1.1:1]/Al organic solar cell has been studied by neutron reflectometry (NR) and hard X-ray photoelectron spectroscopy (HAXPES). Thermal annealing was performed in several steps and NR and HAXPES were recorded for every temperature. By fitting the NR results to a model composed of several layers, the scattering length density (SLD) distribution through the sample was obtained, and from this SLD profile, the evolution of the composition of the active layer as a function of temperature was established. For the outer layers, HAXPES results confirm the composition evolution. The results show that PCBM tends to segregate reducing the initial concentration of PCBM in the central part of the active layer and increasing its concentration towards both interfaces. The effect of the Al electrode as studied by HAXPES on the nearest zone of the active layer (up to 50 nm) is to stabilize the P3HT depletion in this area, an effect which is not affected by thermal annealing.

Place, publisher, year, edition, pages
Elsevier, 2019. Vol. 191, p. 62-70
Keywords [en]
Organic solar cells, Neutron reflectometry, Hard X-ray photoelectron spectroscopy, Conjugated polymers, P3HT:PCBM
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:mau:diva-4938DOI: 10.1016/j.solmat.2018.10.004ISI: 000456640000009Scopus ID: 2-s2.0-85056189690Local ID: 29445OAI: oai:DiVA.org:mau-4938DiVA, id: diva2:1401773
Available from: 2020-02-28 Created: 2020-02-28 Last updated: 2024-08-02Bibliographically approved

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Gonzalez-Martinez, Juan F

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